2023年7月9日发(作者:)
AP5N04MI
40V N-Channel Enhancement Mode MOSFET
DescriptionThe AP5N04MI uses advanced trench technology
to provide excellent RDS(ON), low gate charge and
operation with gate voltages as low as 4.5V. This
device is suitable for use as a
Battery protection or in other Switching application.
General Features
VDS = 40V ID =5.0A
RDS(ON) < 37mΩ @ VGS=10V
Application
Battery protection
Load switch
Uninterruptible power supply
Package Marking and Ordering Information
Product ID
AP5N04MI
Pack
SOT23-3
Marking
MD4-5A
Qty(PCS)
3000
Absolute Maximum Ratings (TA=25℃ unless otherwise noted)
Symbol
VDS
VGS
ID@TA=25℃
ID@TA=70℃
IDM
PD@TA=25℃
TSTG
TJ
RθJA
RθJC
Parameter
Drain-Source Voltage
Gate-Source Voltage
Continuous Drain Current, VGS @ 10V1
Continuous Drain Current, VGS @ 10V1
Pulsed Drain Current2
Total Power Dissipation3
Storage Temperature Range
Operating Junction Temperature Range
Thermal Resistance Junction-ambient
1
Thermal Resistance Junction-Case1
Rating
40
±20
5.0
3.5
14
1
-55 to 150
-55 to 150
125
80
Units
V
V
A
A
A
W
℃
℃
℃/W
℃/W
1
AP5N04MI Rve3.8 臺灣永源微電子科技有限公司
AP5N04MI
Typ.
---
0.032
30
40
1.5
-4.5
---
---
---
8
2.4
5
1.54
1.84
7.8
2.1
29
2.1
452
51
38
---
---
---
Max.
---
---
37
50
2.5
---
1
5
±100
---
4.8
---
---
---
---
---
---
---
---
---
---
4.5
14
1.2
A
A
V
pF
ns
nC
mΩ
V
mV/℃
uA
nA
S
Unit
V
V/℃
40V N-Channel Enhancement Mode MOSFET
Electrical Characteristics
(TA=25℃ unless otherwise noted)
Symbol
BVDSS
Parameter
Drain-Source Breakdown Voltage
Conditions
VGS=0V , ID=250uA
Reference to 25℃ , ID=1mA
VGS=10V , ID=4A
RDS(ON)
VGS(th)
△VGS(th)
IDSS
IGSS
gfs
Rg
Qg
Qgs
Qgd
Td(on)
Tr
Td(off)
Tf
Ciss
Coss
Crss
IS
ISM
VSD
Static Drain-Source On-Resistance2
Gate Threshold Voltage
VGS(th)
Temperature Coefficient
Drain-Source Leakage Current
Gate-Source Leakage Current
Forward Transconductance
Gate Resistance
Total Gate Charge (4.5V)
Gate-Source Charge
Gate-Drain Charge
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Continuous Source Current1,4
Pulsed Source Current2,4
Diode Forward Voltage2
VG=VD=0V , Force Current
VDS=15V , VGS=0V , f=1MHz
VDD=15V , VGS=10V ,
RG=3.3
ID=1A
VDS=15V , VGS=4.5V , ID=3A
VGS=4.5V , ID=3A
VGS=VDS , ID =250uA
VDS=32V , VGS=0V , TJ=25℃
VDS=32V , VGS=0V , TJ=55℃
VGS=±20V , VDS=0V
VDS=5V , ID=4A
VDS=0V , VGS=0V , f=1MHz
Min.
40
---
---
---
1.0
---
---
---
---
---
---
---
---
---
---
---
---
---
---
---
---
---
---
---
△BVDSS/△TJ
BVDSS Temperature Coefficient
Ω
VGS=0V , IS=1A , TJ=25℃
Note :
1
.The data tested by surface mounted on a 1 inch2
FR-4 board with 2OZ copper.
data tested by pulsed , pulse width ≦ 300us , duty cycle ≦ 2%
3
.The power dissipation is limited by 150℃ junction temperature
data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation.
AP5N04MI Rve3.8 臺灣永源微電子科技有限公司
2
AP5N04MI
40V N-Channel Enhancement Mode MOSFET
Typical Characteristics
15
12VGS=10V)A
(
VGS=7Vtner
VGS=5VruC
9
nia
VGS=4.5VVGS=3VrD
6ID
3
0
0V0.511.5DS , Drain-to-Source Voltage (V)2
Fig.1 Typical Output Characteristics
8
)
At(n
6erru
C
e
4cruo
S
TJ=150℃TJ=25℃IS
2
00.000.250.500.751.00
VSD , Source-to-Drain Voltage (V)
Fig.3 Forward Characteristics Of Reverse
1.8
)
V
()
1.4thS(G
Vde
1zila
mro
N
0.6
0.2-5
TJ ,Junction Temperature (℃ )
Fig.5 Normalized VGS(th) vs. TJ
AP5N04MI Rve3.8
50ID=4A)45Ωm
(NSODR403546810VGS (V)
Fig.2 On-Resistance vs. Gate-Source
10VDS=15V)VID=3A
(eg7.5taloV
ecr5uoS
to
te2.5
Ga
SGV002Q.557.5G , Total Gate Char10
Fig.4 Gate-Charge Characteristics
1.8encat1.4isesR
nO
d1.0eizlamorN0.60.2-5TJ , Junction Temperature (℃)
Fig.6 Normalized R3DSON vs. TJ
臺灣永源微電子科技有限公司
AP5N04MI
40V N-Channel Enhancement Mode MOSFET
1000100.00F=1.0MHz
Ciss10.00
1001.00
Coss
0.10Crss
TA=25℃
10Single Pulse0.01
0.1110VDS , Drain to Source Voltage (V)VDS (V)
Fig.7 Capacitance Fig.8 Safe Operating Area
1DUTY=0.5
0.2
0.10.10.05
0.02
0.010.01
P
T0.001SINGLE PULSET
D = T/T
T = T + Px R
0.0001
0.00010.0010.010.1110100
t , Pulse Width (s)
Fig.9 Normalized Maximum Transient Thermal Impedance
VDS
90%
10%
VGSTd(on)TrTd(off)Tf
TonToff
Capacitance
(pF)ID
(A)100us10ms100ms1sDC100
Normalized
Thermal
Response
(R
θJA)DMONONJpeakCDM θJC1000
4
Fig.10 Switching Time Waveform Fig.11 Gate Charge Waveform
AP5N04MI Rve3.8 臺灣永源微電子科技有限公司
AP5N04MI
40V N-Channel Enhancement Mode MOSFET
Package Mechanical Data:SOT23-3L
Symbol
A
A1
A2
b
c
D
E1
E
e
e1
L
θ
Dimensions In Millimeters
Min. Max.
1.050 1.250
0.000 0.100
1.050 1.150
0.300 0.500
0.100 0.200
2.820 3.020
1.500 1.700
2.650 2.950
0.950(BSC)
1.800 2.000
0.300 0.600
0° 8°
Dimensions In Inches
Min. Max.
0.041 0.049
0.000 0.004
0.041 0.045
0.012 0.020
0.004 0.008
0.111 0.119
0.059 0.067
0.104 0.116
0.037(BSC)
0.071 0.079
0.012 0.024
0° 8°
AP5N04MI Rve3.8 臺灣永源微電子科技有限公司
5
AP5N04MI
40V N-Channel Enhancement Mode MOSFET
Attention
1,Any and all APM Microelectronics products described or contained herein do not have specifications
that can handle applications that require extremely high levels of reliability, such as life support systems,
aircraft's control systems, or other applications whose failure can be reasonably expected to result in
serious physical and/or material damage. Consult with your APM Microelectronics representative nearest
you before using any APM Microelectronics products described or contained herein in such applications.
2,APM Microelectronics assumes no responsibility for equipment failures that result from using products
at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition
ranges, or other parameters) listed in products specifications of any and all APM Microelectronics
products described or contained herein.
3, Specifications of any and all APM Microelectronics products described or contained here instipulate the
performance, characteristics, and functions of the described products in the independent state, and are
not guarantees of the performance, characteristics, and functions of the described products as mounted
in the customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an
independent device, the customer should always evaluate and test devices mounted in the customer’s
products or equipment.
4, APM Microelectronics Semiconductor CO., LTD. strives to supply high quality high reliability products.
However, any and all semiconductor products fail with some probability. It is possible that these
probabilistic failures could give rise to accidents or events that could endanger human lives that could
give rise to smoke or fire, or that could cause damage to other property. When designing equipment,
adopt safety measures so that these kinds of accidents or events cannot occur. Such measures include
but are not limited to protective circuits and error prevention circuits for safe design, redundant
design,and structural design.
5,In the event that any or all APM Microelectronics products(including technical data, services) described
or contained herein are controlled under any of applicable local export control laws and regulations, such
products must not be exported without obtaining the export license from the authorities concerned in
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guaranteed for volume production. APM Microelectronics believes information herein is accurate and
reliable, but no guarantees are made or implied regarding its use or any infringements of intellectual
property rights or other rights of third parties.
8, Any and all information described or contained herein are subject to change without notice due to
product/technology improvement,etc. When designing equipment, refer to the "Delivery Specification" for
the APM Microelectronics product that you Intend to use.
AP5N04MI Rve3.8 臺灣永源微電子科技有限公司
6
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