金属代替栅工艺流程

金属代替栅工艺流程


2024年4月11日发(作者:)

金属代替栅工艺流程

英文回答:

Metal replacement gate (MRG) technology is an advanced

process used in semiconductor manufacturing to replace the

traditional polysilicon gate with a metal gate. This

technology offers several advantages over the conventional

polysilicon gate, including improved performance and

reduced power consumption.

The process flow of metal replacement gate technology

involves several steps. First, a high-k dielectric layer is

deposited on the silicon substrate. This dielectric layer

acts as an insulator and helps to improve the gate

capacitance. Next, a metal layer, typically composed of a

refractory metal such as tungsten or titanium, is deposited

on top of the dielectric layer. This metal layer serves as

the gate electrode.

After the metal layer deposition, a patterning step is

performed to define the gate structure. This involves the

use of photolithography techniques to selectively remove

the metal layer and create the desired gate shape. The

remaining metal layer is then annealed to improve its

electrical properties and ensure good contact with the

underlying silicon substrate.

Following the gate patterning, a source and drain

implantation is performed to introduce dopants into the

silicon substrate and create the source and drain regions

of the transistor. This step is crucial for controlling the

conductivity of the transistor and determining its

electrical characteristics.

Finally, the metal replacement gate process is

completed by depositing a passivation layer on top of the

gate structure. This passivation layer acts as a protective

barrier, preventing contamination and ensuring the long-

term reliability of the device.

金属代替栅(Metal Replacement Gate,MRG)工艺是半导体制

造中一种先进的工艺,用于将传统的多晶硅栅替换为金属栅。这种

技术相较于传统的多晶硅栅具有多项优势,包括提高性能和降低功

耗。

金属代替栅工艺的流程包括几个步骤。首先,在硅衬底上沉积

一层高介电常数(high-k)的介电层。这个介电层作为绝缘层,有

助于改善栅电容。接下来,在介电层上方沉积一层金属层,通常采

用钨或钛等耐火金属。这个金属层作为栅极。

在金属层沉积之后,进行图案制作步骤,用于定义栅结构。这

涉及使用光刻技术有选择性地去除金属层,创造出期望的栅形状。

剩余的金属层然后经过退火处理,改善其电学特性,并确保与底部

的硅衬底有良好的接触。

在栅图案制作之后,进行源漏掺杂,将掺杂剂引入硅衬底,形

成晶体管的源和漏区域。这一步骤对于控制晶体管的导电性和确定

其电学特性非常重要。

最后,通过在栅结构上方沉积一层封装层来完成金属代替栅工

艺。这个封装层作为一种保护层,防止污染,确保器件的长期可靠

性。


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